A Transistor-Level Reliability Estimation of CNTFET-Based Multivalued Logic Circuits
Hadi Jahanirad
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Reliability
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tr.2026.3702591
The original publisher provides the full text and its access options.
Cite this source
Hadi Jahanirad. A Transistor-Level Reliability Estimation of CNTFET-Based Multivalued Logic Circuits. IEEE Transactions on Reliability. 2026. https://doi.org/10.1109/tr.2026.3702591