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Research literature / Conference paper

Mix-DeCNN: A Lightweight Multi-Label Framework for Superimposed Defect Decomposition in Semiconductor Manufacturing

Md Hasibul Islam; Md Sohan Sorker; Jonayed Hossen Antor; Neha Ahammed; Md Fanir Al Mamun

Published
Publisher
IEEE
Journal / collection
2026 IEEE 27th International Conference of Young Professionals in Electron Devices and Materials (EDM)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/edm69524.2026.11632237

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Md Hasibul Islam; Md Sohan Sorker; Jonayed Hossen Antor; Neha Ahammed; Md Fanir Al Mamun. Mix-DeCNN: A Lightweight Multi-Label Framework for Superimposed Defect Decomposition in Semiconductor Manufacturing. 2026 IEEE 27th International Conference of Young Professionals in Electron Devices and Materials (EDM). 2026-06. https://doi.org/10.1109/edm69524.2026.11632237

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