Logic-Gate-Based Scan Driver Circuits With Low-Temperature Polycrystalline Silicon and Metal-Oxide Thin-Film Transistor Technology
Han Cheol Lee; Kook Chul Moon; Yong-Sang Kim
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Electron Devices
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/ted.2025.3648977
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Cite this source
Han Cheol Lee; Kook Chul Moon; Yong-Sang Kim. Logic-Gate-Based Scan Driver Circuits With Low-Temperature Polycrystalline Silicon and Metal-Oxide Thin-Film Transistor Technology. IEEE Transactions on Electron Devices. 2026-02. https://doi.org/10.1109/ted.2025.3648977