High-precision semiconductor device detection method based on improved YOLOv8
min shu; feng zhao
- Published
- Publisher
- SPIE
- Journal / collection
- Fourth International Conference on Electronics Technology and Artificial Intelligence (ETAI 2025)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1117/12.3068929
The original publisher provides the full text and its access options.
Cite this source
min shu; feng zhao. High-precision semiconductor device detection method based on improved YOLOv8. Fourth International Conference on Electronics Technology and Artificial Intelligence (ETAI 2025). 2025-07-24. https://doi.org/10.1117/12.3068929