Context-Aware Hough Transforms for Discriminative Line Detections in Semiconductor Metrology Applications
Tamás Reiter; Michael McCann
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 35th Irish Signals and Systems Conference (ISSC)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/issc67739.2025.11291356
The original publisher provides the full text and its access options.
Cite this source
Tamás Reiter; Michael McCann. Context-Aware Hough Transforms for Discriminative Line Detections in Semiconductor Metrology Applications. 2025 35th Irish Signals and Systems Conference (ISSC). 2025-06-09. https://doi.org/10.1109/issc67739.2025.11291356