Leak-CIM: A PVT-Robust and Energy-Efficient SRAM Computing-in-Memory Macro Exploiting Transistor Leakage
Hiroto Tagata; Takashi Sato; Hiromitsu Awano
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tvlsi.2026.3732384
The original publisher provides the full text and its access options.
Cite this source
Hiroto Tagata; Takashi Sato; Hiromitsu Awano. Leak-CIM: A PVT-Robust and Energy-Efficient SRAM Computing-in-Memory Macro Exploiting Transistor Leakage. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2026. https://doi.org/10.1109/tvlsi.2026.3732384