A stacked regression–based TCAD–ML framework for accelerated GaN transistor design
Menglan Ji; Tianhao Wang; Yuanfeng Chen; Yuqi Zhang; Guanjun Wang; Jialin Zhang
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Microelectronics Journal
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.mejo.2026.107086
The original publisher provides the full text and its access options.
Cite this source
Menglan Ji; Tianhao Wang; Yuanfeng Chen; Yuqi Zhang; Guanjun Wang; Jialin Zhang. A stacked regression–based TCAD–ML framework for accelerated GaN transistor design. Microelectronics Journal. 2026-04. https://doi.org/10.1016/j.mejo.2026.107086