In-Memory Computation Using Positive Feedback Field Effect Transistor Array Based on Charge Trap Layer for Boolean Logic Operations
Hyunjun Yeom; Jaewon Lee; Min-Woo Kwon
- Published
- Publisher
- The Japan Society of Applied Physics
- Journal / collection
- Extended Abstracts of the 2025 International Conference on Solid State Devices and Materials
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.7567/ssdm.2025.ps-02-12
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Cite this source
Hyunjun Yeom; Jaewon Lee; Min-Woo Kwon. In-Memory Computation Using Positive Feedback Field Effect Transistor Array Based on Charge Trap Layer for Boolean Logic Operations. Extended Abstracts of the 2025 International Conference on Solid State Devices and Materials. 2025-09-17. https://doi.org/10.7567/ssdm.2025.ps-02-12