Label recognition on metal surfaces in semiconductor industry by YOLO object detection model
Wei-Chang Yeh; Shao-Yu Liao; Chia-Ling Huang
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- The International Journal of Advanced Manufacturing Technology
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1007/s00170-025-15489-9
The original publisher provides the full text and its access options.
Cite this source
Wei-Chang Yeh; Shao-Yu Liao; Chia-Ling Huang. Label recognition on metal surfaces in semiconductor industry by YOLO object detection model. The International Journal of Advanced Manufacturing Technology. 2025-05. https://doi.org/10.1007/s00170-025-15489-9