Topological failure mode taxonomy and variation-aware design space exploration of carbon nanotube field-effect transistor flip-flops under process-induced geometric perturbations
M. Chandana; Owais Ahmad Shah; Vakkalakula Bharath Sreenivasulu
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Scientific Reports
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1038/s41598-026-59774-3
The original publisher provides the full text and its access options.
Cite this source
M. Chandana; Owais Ahmad Shah; Vakkalakula Bharath Sreenivasulu. Topological failure mode taxonomy and variation-aware design space exploration of carbon nanotube field-effect transistor flip-flops under process-induced geometric perturbations. Scientific Reports. 2026-07-03. https://doi.org/10.1038/s41598-026-59774-3