Region Segmentation for Efficient Semiconductor Inspection: A Deep Learning Approach with Transformers and Atrous Convolution
Herman Koara; Hai Gong; Chao Xu; Shengze Cai; Xu Zhou
- Published
- Publisher
- MDPI AG
- Journal / collection
- Electronics
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.3390/electronics14163260
The original publisher provides the full text and its access options.
Cite this source
Herman Koara; Hai Gong; Chao Xu; Shengze Cai; Xu Zhou. Region Segmentation for Efficient Semiconductor Inspection: A Deep Learning Approach with Transformers and Atrous Convolution. Electronics. 2025-08-17. https://doi.org/10.3390/electronics14163260