Unifying Field and Temperature Acceleration in Semiconductor Device Reliability Through Entropic Kinetics
Liron Cohen; Lidor Bazon; Joseph B. Bernstein
- Published
- Publisher
- MDPI AG
- Journal / collection
- Micromachines
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.3390/mi17101116
The original publisher provides the full text and its access options.
Cite this source
Liron Cohen; Lidor Bazon; Joseph B. Bernstein. Unifying Field and Temperature Acceleration in Semiconductor Device Reliability Through Entropic Kinetics. Micromachines. 2026-09-24. https://doi.org/10.3390/mi17101116