A Study on the Multi-Output MOSFET Probing Circuits for In-situ Observation of Integrated Circuit Operation
Atsumi Ito; Tomochika Harada
- Published
- Publisher
- Institute of Electrical Engineers of Japan (IEE Japan)
- Journal / collection
- IEEJ Transactions on Sensors and Micromachines
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1541/ieejsmas.146.281
The original publisher provides the full text and its access options.
Cite this source
Atsumi Ito; Tomochika Harada. A Study on the Multi-Output MOSFET Probing Circuits for In-situ Observation of Integrated Circuit Operation. IEEJ Transactions on Sensors and Micromachines. 2026-10-01. https://doi.org/10.1541/ieejsmas.146.281