Investigation of low to high-dose gamma-ray (γ-ray) radiation effects on indium-zinc-oxide (IZO) thin film transistor (TFT)
Do-Kywn Kim; Dong-Seok Kim; Tae-Eon Kim; Min-Ju Kim; Seung Heon Shin
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Solid-State Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.sse.2024.108884
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Cite this source
Do-Kywn Kim; Dong-Seok Kim; Tae-Eon Kim; Min-Ju Kim; Seung Heon Shin. Investigation of low to high-dose gamma-ray (γ-ray) radiation effects on indium-zinc-oxide (IZO) thin film transistor (TFT). Solid-State Electronics. 2024-05. https://doi.org/10.1016/j.sse.2024.108884