A Study on Semiconductor Device Training Using Digital-Twins and Solid-edge
Eugene Jeon; Yeon Hee Kim; Gyeong Min Lee
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 9th International Conference on Integrated Circuits and Microsystems (ICICM)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/icicm63644.2024.10814441
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Cite this source
Eugene Jeon; Yeon Hee Kim; Gyeong Min Lee. A Study on Semiconductor Device Training Using Digital-Twins and Solid-edge. 2024 9th International Conference on Integrated Circuits and Microsystems (ICICM). 2024-10-25. https://doi.org/10.1109/icicm63644.2024.10814441