YOLOv4-Based Semiconductor Wafer Notch Detection Using Deep Learning and Image Enhancement Algorithms
Hao Wang; Hyo Jun Sim; Jong Jin Hwang; Sung Jin Kwak; Seung Jae Moon
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- International Journal of Precision Engineering and Manufacturing
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.1007/s12541-024-01092-7
The original publisher provides the full text and its access options.
Cite this source
Hao Wang; Hyo Jun Sim; Jong Jin Hwang; Sung Jin Kwak; Seung Jae Moon. YOLOv4-Based Semiconductor Wafer Notch Detection Using Deep Learning and Image Enhancement Algorithms. International Journal of Precision Engineering and Manufacturing. 2024-08-16. https://doi.org/10.1007/s12541-024-01092-7