Understanding Transistor Aging Impact on the Behavior of RRAM Cells
Seyed Hossein Hashemi Shadmehri; Supriya Chakraborty; Thiago Santos Copetti; Fabian Luis Vargas; Letícia Maria Bolzani Poehls
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/vlsi-soc62099.2024.10767807
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Cite this source
Seyed Hossein Hashemi Shadmehri; Supriya Chakraborty; Thiago Santos Copetti; Fabian Luis Vargas; Letícia Maria Bolzani Poehls. Understanding Transistor Aging Impact on the Behavior of RRAM Cells. 2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC). 2024-10-06. https://doi.org/10.1109/vlsi-soc62099.2024.10767807