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Research literature / Conference paper

Can Large Language Model Detect Plagiarism in Source Code?

William Brach; Kristián Košt’ál; Michal Ries

Published
Publisher
IEEE
Journal / collection
2024 2nd International Conference on Foundation and Large Language Models (FLLM)
Research area
AI & compute
Source type
Conference paper
DOI
10.1109/fllm63129.2024.10852497

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William Brach; Kristián Košt’ál; Michal Ries. Can Large Language Model Detect Plagiarism in Source Code?. 2024 2nd International Conference on Foundation and Large Language Models (FLLM). 2024-11-26. https://doi.org/10.1109/fllm63129.2024.10852497

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