Chip Appearance Inspection Using Machine Learning Techniques
Yuchao Shen
- Published
- Publisher
- Dean & Francis Press
- Journal / collection
- Science and Technology of Engineering, Chemistry and Environmental Protection
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.61173/96ajbn41
The original publisher provides the full text and its access options.
Cite this source
Yuchao Shen. Chip Appearance Inspection Using Machine Learning Techniques. Science and Technology of Engineering, Chemistry and Environmental Protection. 2024-10-29. https://doi.org/10.61173/96ajbn41