In-Circuit Inductance Measurement to Correct the Single-Pulse Avalanche Energy ( E as ) of Transistor Under the Unclamped Inductive-Switching (UIS) Test
Jian-Hsing Lee; Ching-Ho Li; Chih-Cherng Liao; Gong-Kai Lin; Yu-Sheng Chiu; Chieh-Yao Chuang; Ke-Horng Chen
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Electron Devices
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/ted.2024.3509398
The original publisher provides the full text and its access options.
Cite this source
Jian-Hsing Lee; Ching-Ho Li; Chih-Cherng Liao; Gong-Kai Lin; Yu-Sheng Chiu; Chieh-Yao Chuang; Ke-Horng Chen. In-Circuit Inductance Measurement to Correct the Single-Pulse Avalanche Energy ( E as ) of Transistor Under the Unclamped Inductive-Switching (UIS) Test. IEEE Transactions on Electron Devices. 2025-01. https://doi.org/10.1109/ted.2024.3509398