Integrated design and reliability enhancement technology of quantum current sensor for non-invasive measurement in power grid
Chun Li; Maoheng Jing; Wenhao Lu; Ximing Gao; Dong Feng; Gulin Xia
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Discover Applied Sciences
- Research area
- Energy & infrastructure
- Source type
- Journal article
- DOI
- 10.1007/s42452-026-09590-1
The original publisher provides the full text and its access options.
Cite this source
Chun Li; Maoheng Jing; Wenhao Lu; Ximing Gao; Dong Feng; Gulin Xia. Integrated design and reliability enhancement technology of quantum current sensor for non-invasive measurement in power grid. Discover Applied Sciences. 2026-10-02. https://doi.org/10.1007/s42452-026-09590-1