Integrated metrology for advanced manufacturing
Andreas Archenti; Wei Gao; Alkan Donmez; Enrico Savio; Naruhiro Irino
- Published
- Publisher
- Elsevier BV
- Journal / collection
- CIRP Annals
- Research area
- Industrial systems
- Source type
- Journal article
- DOI
- 10.1016/j.cirp.2024.05.003
The original publisher provides the full text and its access options.
Cite this source
Andreas Archenti; Wei Gao; Alkan Donmez; Enrico Savio; Naruhiro Irino. Integrated metrology for advanced manufacturing. CIRP Annals. 2024. https://doi.org/10.1016/j.cirp.2024.05.003