Investigation and Mitigation of Transistor Induced Reliability Issues in 40NM RRAM Array
Yuhang Yang; Zongwei Wang; Haoran Wang; Lin Bao; Gaoqi Yang; Yimao Cai; Ru Huang
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE International Reliability Physics Symposium (IRPS)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/irps48204.2025.10983529
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Cite this source
Yuhang Yang; Zongwei Wang; Haoran Wang; Lin Bao; Gaoqi Yang; Yimao Cai; Ru Huang. Investigation and Mitigation of Transistor Induced Reliability Issues in 40NM RRAM Array. 2025 IEEE International Reliability Physics Symposium (IRPS). 2025-03-30. https://doi.org/10.1109/irps48204.2025.10983529