Exposure defect detection method of semiconductor lead frame based on improved YOLOv8
Wanyu Deng; Xinlei Shang; Zebin Jiang
- Published
- Publisher
- ACM
- Journal / collection
- Proceedings of the 2024 7th International Conference on Artificial Intelligence and Pattern Recognition
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1145/3703935.3704057
The original publisher provides the full text and its access options.
Cite this source
Wanyu Deng; Xinlei Shang; Zebin Jiang. Exposure defect detection method of semiconductor lead frame based on improved YOLOv8. Proceedings of the 2024 7th International Conference on Artificial Intelligence and Pattern Recognition. 2024-09-20. https://doi.org/10.1145/3703935.3704057