Temperature Sensitivity Assessment of Nonlinear Channel Tunnel Field-Effect Transistor for Raised Efficiency and Reliability in Nanoscale Electronics
Rajeev Kumar Sachan; Vedvrat; Shrish Bajpai
- Published
- Publisher
- Asian Research Association
- Journal / collection
- International Research Journal of Multidisciplinary Technovation
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.54392/irjmt25218
The original publisher provides the full text and its access options.
Cite this source
Rajeev Kumar Sachan; Vedvrat; Shrish Bajpai. Temperature Sensitivity Assessment of Nonlinear Channel Tunnel Field-Effect Transistor for Raised Efficiency and Reliability in Nanoscale Electronics. International Research Journal of Multidisciplinary Technovation. 2025-03-30. https://doi.org/10.54392/irjmt25218