Analysis of Fermi level pinning characteristics in erbium silicided metal–semiconductor interface
Seok-kyu Kim; Soyeon Jeong; Jaemin Kim; Moongyu Jang
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Journal of the Korean Physical Society
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1007/s40042-024-01178-5
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Cite this source
Seok-kyu Kim; Soyeon Jeong; Jaemin Kim; Moongyu Jang. Analysis of Fermi level pinning characteristics in erbium silicided metal–semiconductor interface. Journal of the Korean Physical Society. 2024-09-25. https://doi.org/10.1007/s40042-024-01178-5