Field Induced Off‐State Instability in InGaZnO Thin‐Film Transistor and its Impact on Synaptic Circuits
Minseung Kang; Ung Cho; Jaehyeon Kang; Narae Han; Hyeong Jun Seo; Jee‐Eun Yang; Seokyeon Shin; Taehyun Kim; Sangwook Kim; Changwook Jeong; Sangbum Kim
- Published
- Publisher
- Wiley
- Journal / collection
- Advanced Electronic Materials
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1002/aelm.202300900
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Cite this source
Minseung Kang; Ung Cho; Jaehyeon Kang; Narae Han; Hyeong Jun Seo; Jee‐Eun Yang; Seokyeon Shin; Taehyun Kim; Sangwook Kim; Changwook Jeong; Sangbum Kim. Field Induced Off‐State Instability in InGaZnO Thin‐Film Transistor and its Impact on Synaptic Circuits. Advanced Electronic Materials. 2024-05-08. https://doi.org/10.1002/aelm.202300900