Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Conference paper

Layer Resolved Thermal Impedance Measurement with Laser Stimulated Transient Thermal Analysis of Semiconductor Modules

Hannes Schwan; Maximilian Schmid; Gordon Elger

Published
Publisher
IEEE
Journal / collection
2024 30th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/therminic62015.2024.10732233

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Hannes Schwan; Maximilian Schmid; Gordon Elger. Layer Resolved Thermal Impedance Measurement with Laser Stimulated Transient Thermal Analysis of Semiconductor Modules. 2024 30th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC). 2024-09-25. https://doi.org/10.1109/therminic62015.2024.10732233

Download RIS