Fast Schedule Recovery Method for Semiconductor Packaging Lines With Machine Failures and Constrained Time Windows
Feifan Wang; Yutong Su; Feng Ju; Balakrishnan Ananthanarayanan; Husam Dauod; Nital S. Patel
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Automation Science and Engineering
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tase.2024.3357610
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Cite this source
Feifan Wang; Yutong Su; Feng Ju; Balakrishnan Ananthanarayanan; Husam Dauod; Nital S. Patel. Fast Schedule Recovery Method for Semiconductor Packaging Lines With Machine Failures and Constrained Time Windows. IEEE Transactions on Automation Science and Engineering. 2025. https://doi.org/10.1109/tase.2024.3357610