Review of: "First, with the increase in electric charge density, the possibility of electric charge discharge from the insulating areas of the transistor increases , and this causes damage to the transistor and its failure"
Joseph Mayer
- Published
- Publisher
- Qeios Ltd
- Journal / collection
- Qeios
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.32388/7nuew9
The original publisher provides the full text and its access options.
Cite this source
Joseph Mayer. Review of: "First, with the increase in electric charge density, the possibility of electric charge discharge from the insulating areas of the transistor increases , and this causes damage to the transistor and its failure". Qeios. 2024-01-17. https://doi.org/10.32388/7nuew9