Hydroxyethyl Cellulose Charge Trap Layer for Water-Degradable Short-Term Transistor Memory
Jeong-In Lee; Baeksang Sung; Joo Won Han; Yong Hyun Kim; Jonghee Lee; Min-Hoi Kim
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Electronic Materials Letters
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1007/s13391-025-00553-z
The original publisher provides the full text and its access options.
Cite this source
Jeong-In Lee; Baeksang Sung; Joo Won Han; Yong Hyun Kim; Jonghee Lee; Min-Hoi Kim. Hydroxyethyl Cellulose Charge Trap Layer for Water-Degradable Short-Term Transistor Memory. Electronic Materials Letters. 2025-02-22. https://doi.org/10.1007/s13391-025-00553-z