Fundamental Aspects of Semiconductor Device Modeling Associated With Discrete Impurities: Nonequilibrium Green’s Function Scheme
Nobuyuki Sano
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Electron Devices
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/ted.2024.3499940
The original publisher provides the full text and its access options.
Cite this source
Nobuyuki Sano. Fundamental Aspects of Semiconductor Device Modeling Associated With Discrete Impurities: Nonequilibrium Green’s Function Scheme. IEEE Transactions on Electron Devices. 2025-01. https://doi.org/10.1109/ted.2024.3499940