Exploring the Structure of the Chiral, One-Dimensional Semiconductor InSeI Via High-Resolution Electron Microscopy
Patrick Hays; Melike Erdi; Brent Nannenga; Dewight Williams; Sefaattin Tongay; Sandhya Susarla
- Published
- Publisher
- Oxford University Press (OUP)
- Journal / collection
- Microscopy and Microanalysis
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1093/mam/ozae044.751
The original publisher provides the full text and its access options.
Cite this source
Patrick Hays; Melike Erdi; Brent Nannenga; Dewight Williams; Sefaattin Tongay; Sandhya Susarla. Exploring the Structure of the Chiral, One-Dimensional Semiconductor InSeI Via High-Resolution Electron Microscopy. Microscopy and Microanalysis. 2024-07. https://doi.org/10.1093/mam/ozae044.751