Silicon-Germanium Ultrashort-Gate Transistor Performances by Electrical-Thermal Simulations
Shiun Yamakiri; Takaya Sugiura; Kenta Yamamura; Yuta Watanabe; Nobuhiko Nakano
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Nanotechnology
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tnano.2024.3389209
The original publisher provides the full text and its access options.
Cite this source
Shiun Yamakiri; Takaya Sugiura; Kenta Yamamura; Yuta Watanabe; Nobuhiko Nakano. Silicon-Germanium Ultrashort-Gate Transistor Performances by Electrical-Thermal Simulations. IEEE Transactions on Nanotechnology. 2024. https://doi.org/10.1109/tnano.2024.3389209