Functional Confirmation Using a Medical X-Ray System of a Semiconductor Survey Meter
Katsunao Suzuki; Toru Negishi; Yoh Kato; Yasuhisa Kono; Michiharu Sekimoto
- Published
- Publisher
- Scientific Research Publishing, Inc.
- Journal / collection
- Open Journal of Radiology
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.4236/ojrad.2024.141001
The original publisher provides the full text and its access options.
Cite this source
Katsunao Suzuki; Toru Negishi; Yoh Kato; Yasuhisa Kono; Michiharu Sekimoto. Functional Confirmation Using a Medical X-Ray System of a Semiconductor Survey Meter. Open Journal of Radiology. 2024. https://doi.org/10.4236/ojrad.2024.141001