The Electronic Impact of X-Ray on Atomically-Thin Oxide Semiconductor Devices
Tzu-Jie Lin; Robert Tseng; Chan-Yuen Chang; Tsung-Te Chou; Der-Hsien Lien
- Published
- Publisher
- The Electrochemical Society
- Journal / collection
- ECS Meeting Abstracts
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1149/ma2024-01321584mtgabs
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Cite this source
Tzu-Jie Lin; Robert Tseng; Chan-Yuen Chang; Tsung-Te Chou; Der-Hsien Lien. The Electronic Impact of X-Ray on Atomically-Thin Oxide Semiconductor Devices. ECS Meeting Abstracts. 2024-08-09. https://doi.org/10.1149/ma2024-01321584mtgabs