Improved Power Semiconductor Dynamic Testing Circuit to Suppress Leakage Current
Xiaoshuang Hui; Puqi Ning; Dan Zheng; Tao Fan; Kai Wang; Yunhui Mei
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Journal of Emerging and Selected Topics in Power Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/jestpe.2024.3403105
The original publisher provides the full text and its access options.
Cite this source
Xiaoshuang Hui; Puqi Ning; Dan Zheng; Tao Fan; Kai Wang; Yunhui Mei. Improved Power Semiconductor Dynamic Testing Circuit to Suppress Leakage Current. IEEE Journal of Emerging and Selected Topics in Power Electronics. 2024-12. https://doi.org/10.1109/jestpe.2024.3403105