Multi-Parameter Degradation Modeling Method for Power Mosfets Integrating Semiconductor Physics Degradation Data
Chenyi Wang; Hao Chen; Yifan Hu; Haodong Wang; WeiXuan Kong; Xuerong Ye
- Published
- Publisher
- Elsevier BV
- Research area
- Semiconductors
- Source type
- Preprint / posted paper
- DOI
- 10.2139/ssrn.4923323
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Cite this source
Chenyi Wang; Hao Chen; Yifan Hu; Haodong Wang; WeiXuan Kong; Xuerong Ye. Multi-Parameter Degradation Modeling Method for Power Mosfets Integrating Semiconductor Physics Degradation Data. Elsevier BV. 2024. https://doi.org/10.2139/ssrn.4923323