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Research literature / Preprint / posted paper

Analysis of Leakage Current Mechanisms in AlInGaN/GaN Metal-Insulator-Semiconductor Capacitors

Guiyu Shen; Ying wang; Yulong Fang; Yongchuan Tang; He Guan

Published
Publisher
Elsevier BV
Research area
Semiconductors
Source type
Preprint / posted paper
DOI
10.2139/ssrn.5440575

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Guiyu Shen; Ying wang; Yulong Fang; Yongchuan Tang; He Guan. Analysis of Leakage Current Mechanisms in AlInGaN/GaN Metal-Insulator-Semiconductor Capacitors. Elsevier BV. 2025. https://doi.org/10.2139/ssrn.5440575

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