Detection of Semiconductor Test Pins Defects using Neural Networks
Young-Ju Kim; Cheon-Deok Jin
- Published
- Publisher
- The Institute of Electronics Engineers of Korea
- Journal / collection
- Journal of the Institute of Electronics and Information Engineers
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.5573/ieie.2024.61.2.43
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Cite this source
Young-Ju Kim; Cheon-Deok Jin. Detection of Semiconductor Test Pins Defects using Neural Networks. Journal of the Institute of Electronics and Information Engineers. 2024-02-29. https://doi.org/10.5573/ieie.2024.61.2.43