Reliability issues of amorphous oxide semiconductor-based thin film transistors
Yuxuan Shen; Meng Zhang; Siyuan He; Le Bian; Jiaxin Liu; Zhengyu Chen; Shuangmei Xue; Ye Zhou; Yan Yan
- Published
- Publisher
- Royal Society of Chemistry (RSC)
- Journal / collection
- Journal of Materials Chemistry C
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1039/d4tc01392a
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Cite this source
Yuxuan Shen; Meng Zhang; Siyuan He; Le Bian; Jiaxin Liu; Zhengyu Chen; Shuangmei Xue; Ye Zhou; Yan Yan. Reliability issues of amorphous oxide semiconductor-based thin film transistors. Journal of Materials Chemistry C. 2024. https://doi.org/10.1039/d4tc01392a