Modeling and analysis of key impact mechanisms of voltage quality considering large-scale wind power grid-connected scenarios
Hang Meng; Rongzhu Chen; Shan Huang; Yongli Yi; Beilei Huang; Chengcheng Liao
- Published
- Publisher
- Institution of Engineering and Technology (IET)
- Journal / collection
- IET Conference Proceedings
- Research area
- Energy & infrastructure
- Source type
- Journal article
- DOI
- 10.1049/icp.2024.2250
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Cite this source
Hang Meng; Rongzhu Chen; Shan Huang; Yongli Yi; Beilei Huang; Chengcheng Liao. Modeling and analysis of key impact mechanisms of voltage quality considering large-scale wind power grid-connected scenarios. IET Conference Proceedings. 2025-05. https://doi.org/10.1049/icp.2024.2250