An automatic apparatus with sliding probe to determine the interface resistivity for thermoelectric semiconductor
Xilin Huang; Dezhu Sun; Zhenrong Hu; Chunlin Zhang; Xiaokai Hu
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Measurement
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.measurement.2024.114811
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Cite this source
Xilin Huang; Dezhu Sun; Zhenrong Hu; Chunlin Zhang; Xiaokai Hu. An automatic apparatus with sliding probe to determine the interface resistivity for thermoelectric semiconductor. Measurement. 2024-07. https://doi.org/10.1016/j.measurement.2024.114811