Semiconductor Wafer Map Defect Classification Using Convolutional Neural Networks on Imbalanced Classes
Nian Zhang; Wagdy H. Mahmoud
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 17th International Conference on Advanced Computational Intelligence (ICACI)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/icaci65340.2025.11096243
The original publisher provides the full text and its access options.
Cite this source
Nian Zhang; Wagdy H. Mahmoud. Semiconductor Wafer Map Defect Classification Using Convolutional Neural Networks on Imbalanced Classes. 2025 17th International Conference on Advanced Computational Intelligence (ICACI). 2025-07-07. https://doi.org/10.1109/icaci65340.2025.11096243