Comprehensive thermal property measurement of semiconductor heterostructures using the square-pulsed source (SPS) method
Shangzhi Song; Tao Chen; Puqing Jiang
- Published
- Publisher
- AIP Publishing
- Journal / collection
- Journal of Applied Physics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1063/5.0244681
The original publisher provides the full text and its access options.
Cite this source
Shangzhi Song; Tao Chen; Puqing Jiang. Comprehensive thermal property measurement of semiconductor heterostructures using the square-pulsed source (SPS) method. Journal of Applied Physics. 2025-02-03. https://doi.org/10.1063/5.0244681