Analyzing Interface Trap Influence on Sensitivity, Noise, and Response Time in 2-D Material Field-Effect Transistor pH Sensors: A Theoretical Framework
S. Sarath; Rajendra P. Shukla; Chandan Yadav; Gopi Krishna Saramekala
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Sensors Journal
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/jsen.2024.3472729
The original publisher provides the full text and its access options.
Cite this source
S. Sarath; Rajendra P. Shukla; Chandan Yadav; Gopi Krishna Saramekala. Analyzing Interface Trap Influence on Sensitivity, Noise, and Response Time in 2-D Material Field-Effect Transistor pH Sensors: A Theoretical Framework. IEEE Sensors Journal. 2024-11-15. https://doi.org/10.1109/jsen.2024.3472729