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Research literature / Conference paper

Evaluation of Radiation Tolerance of Neutron-Sensitive Semiconductor Lithium Indium Phosphor Selenide

E. K. Hoegberg; E. Qian; A. Benkechkache; E. D. Lukosi; M. Kanatzidis; L. Stand Stracuzzi

Published
Publisher
IEEE
Journal / collection
2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/nss/mic/rtsd57108.2024.10657683

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E. K. Hoegberg; E. Qian; A. Benkechkache; E. D. Lukosi; M. Kanatzidis; L. Stand Stracuzzi. Evaluation of Radiation Tolerance of Neutron-Sensitive Semiconductor Lithium Indium Phosphor Selenide. 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD). 2024-10-26. https://doi.org/10.1109/nss/mic/rtsd57108.2024.10657683

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