Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Conference paper

Thermoreflectance Spectroscopy Technique: An Advanced Tool for Investigation of Thermal Phenomena in Semiconductor Devices

Dorota Pierścińska; Agata Krząstek; Michał Nagowski; Katarzyna Pieniak; Dominika Niewczas; Artur Broda; Kamil Pierściński

Published
Publisher
IEEE
Journal / collection
2024 24th International Conference on Transparent Optical Networks (ICTON)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/icton62926.2024.10647757

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Dorota Pierścińska; Agata Krząstek; Michał Nagowski; Katarzyna Pieniak; Dominika Niewczas; Artur Broda; Kamil Pierściński. Thermoreflectance Spectroscopy Technique: An Advanced Tool for Investigation of Thermal Phenomena in Semiconductor Devices. 2024 24th International Conference on Transparent Optical Networks (ICTON). 2024-07-14. https://doi.org/10.1109/icton62926.2024.10647757

Download RIS