Real time inferencing of semiconductor wafer probing process using Machine Learning
Michael Thavarajah
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE 40th International Electronics Manufacturing Technology (IEMT)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/iemt61324.2024.10875232
The original publisher provides the full text and its access options.
Cite this source
Michael Thavarajah. Real time inferencing of semiconductor wafer probing process using Machine Learning. 2024 IEEE 40th International Electronics Manufacturing Technology (IEMT). 2024-10-16. https://doi.org/10.1109/iemt61324.2024.10875232