Individual Identification Method for Electronic Devices Using Differences in Spectrum Emissions Caused by Manufacturing and Assembly Variations
Koki Abe; Shugo Kaji; Daisuke Fujimoto; Masahiro Kinugawa; Laurent Sauvage; Jean-Luc Danger; Yuichi Hayashi
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEICE Communications Express
- Research area
- Industrial systems
- Source type
- Journal article
- DOI
- 10.23919/comex.2026xbl0124
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Cite this source
Koki Abe; Shugo Kaji; Daisuke Fujimoto; Masahiro Kinugawa; Laurent Sauvage; Jean-Luc Danger; Yuichi Hayashi. Individual Identification Method for Electronic Devices Using Differences in Spectrum Emissions Caused by Manufacturing and Assembly Variations. IEICE Communications Express. 2026-10. https://doi.org/10.23919/comex.2026xbl0124